The newly built (September, 2005) Kelley Engineering Center houses the Applied Magnetics Laboratory in a 600 ft2 space. The research is dedicated to the discovery, development and characterization of magnetic materials and devices. Facilities include:
Magnetic material characterization:
Hall probes and gaussmeters
- Gaussmeter / Teslameter (Sypris T&M - FW Bell 7010)
- Gaussmeter (Lakeshore 450)
- DSP gaussmeter (Lakeshore 475)
- 3-channel gaussmeter (Lakeshore 460)
- BH Looper (Shb Instruments Inc. MESA system with 3” magnetostriction pickup assembly)
- Vibrating sample magnetometer (VSM)
- Kerr microscope
- Magnetic Shield from Amuneal Corp. to reduce DC magnetic fields to below 1 picotesla.
Device characterization tools:
- Helmholtz coils
- Water cooled resistive magnet for fields up to 1.2 Tesla
- 0.3 Tesla projected field electromagnet (Model 5201, GMW Associates)
- Power supplies and data acquisition (DAQ) cards.
- Benchtop RF wafer probe station with 1 - 40 GHz capability
- 4 arm probe station (Model EMPX-HF, LakeShore Cryotronics, Inc.)
- RF amplifier, 1 - 1000 MHz frequency range, 4 Watts (OPHIRRF 5094F)
- RF amplifier, 2 - 8 GHz frequency range, 3 Watts
- RF amplifier, 4.0 - 10.6 GHz frequency range, 1 Watt (AR 1S4G11)
- Audio amplifier, 4,000 Watts (EUROPOWER EP4000)
- Network analyzer, 9 kHz - 8.5 GHz frequency range (Agilent ENA5071C-280)
- PNA network analyzer, 10 MHz - 43.5 GHz frequency range (Agilent N5224A-200)
- RF impedance analyzer, 1 MHz - 3 GHz frequency range (Agilent E4991A)
- 4 channel, 1 GHz oscilloscope (Agilent MSO6104A)
- 4 channel, 1 GHz oscilloscope (Tektronix DPO4104)
- DC - 70 GHz sampling oscilloscope (Tektronix DSA8200)
• 80E03 20 GHz 2-channel sampling module
• 80E08 30 GHz 2-channel time-domain reflectometry (TDR) sampling module
• Z-line software for impedance deconvolution
- Dual phase lock-in amplifier, 1 mHz - 102 kHz frequency range (Stanford Research Systems SR830)
- Tunable analog filter (Stanford Research Systems SIM965)
- Isolated voltage source (Stanford Research Systems SIM928)
- Low noise (4 nV/√Hz) programmable voltage preamplifier (Stanford Research Systems SIM910)
Arbitrary waveform generators
- 10-bit, 1.25 GS/s arbitrary waveform generator (Agilent N8242A)
- 10-bit, 10 GS/s arbitrary waveform generator (Tektronix AWG7102)
- 14-bit, 250 MS/s arbitrary function generator (Tekronix AFG3022B)
- Function generator, 0.5 Hz - 5 MHz frequency range (BK Precision 4011A)
- RF signal generator, DC - 4 GHz frequency range (Stanford Research Systems SG384/2)
- Analog signal generator, 100 kHz - 3 GHz frequency range (Agilent N5181A)
- Analog signal generator, 100 kHz - 20 GHz frequency range (Agilent N5183A)
- Semiconductor device analyzer, 0.5 µV, 10 fA (Agilent B1500A)
- LCR meter, 100 Hz - 2 kHz test frequency range (GW Instek LCR 816)
- Real time spectrum analyzer, DC - 8 GHz frequency range (Tektronix RSA3308B)
- Manual wire bonder (Model 747677E, WestBond, Inc. )
- Cadence and Mentor Graphics tools for physical layout and lithographic mask design.
- Ansoft finite element analysis magnetic simulation software.
- NIST μmag Micromagnetic Modelling software.
- SPICE electrical modeling software.
Solid State Materials & Devices Research Laboratory
This is a 3000 ft2 class 1000 clean room to support the fabrication and characterization of electronic, magnetic, optical and microwave materials and devices. Equipment for processing include systems for atomic layer deposition, RF sputtering, ion beam sputtering, thermal and electron beam evaporation, activated reactive evaporation, plasma-enhanced chemical vapor deposition, reactive ion etching, rapid thermal processing, wet chemical processing, and photolithography. Also available, for a user fee, are optical mask generating and direct write lithography capabilities. Characterization equipment includes optical and mechanical thin film measurement systems, Auger electron spectroscopy, scanning electron spectroscopy, and measurement systems for the electrical and microwave analysis.
This facility provides extensive equipment for time-and frequency-domain measurement and characterization of active and passive devices and structures, including electronic packaging and interconnects. The equipment list includes sampling oscilloscopes with multiple 20 GHz sampling heads, spectrum analyzers, noise figure meter, probe station, and electromagnetic interference (EMI) measurement systems. In addition to the measurement equipment, microwave design software suite and electromagnetic simulators are available.
The College of Engineering at Oregon State University maintains a fully equipped machine shop with a full time machinist in support of research activities. This facility is available on a fee basis. In addition, a 3D printer (Dimension BST 1200) for creating ABS plastic components is accessible for research applications.
Oregon Nanoscience and Microtechnologies Institute (ONAMI)
ONAMI Facilities Weblink
As a member of ONAMI, the research team also has access to the facilities of all participating institutions namely, OSU, Portland State University (PSU), University of Oregon (UO) and Pacific Northwest National Laboratory (PNNL). These facilities lie within at most a 4-hour drive from Corvallis. Relevant equipment available at these institutions include: solid state lasers, atomic force microscope (AFM), magnetic force microscope (MFM), electron microscope and a SQUID magnetometer.